YASEEN , N. A. .; ALRAWE, W. S. A.; KHUDHUR , K. A. khudhur . Performance Evaluation of a Low Energy Universal Gate for VLSI with 16nm Technology. NTU Journal of Engineering and Technology, [S. l.], v. 1, n. 3, 2022. DOI: 10.56286/ntujet.v1i3.209. Disponível em: https://journals.ntu.edu.iq/index.php/NTU-JET/article/view/209. Acesso em: 30 apr. 2024.