Yaseen , N.A. , alrawe, W.S.A. and khudhur , K.A. khudhur . 2022. Performance Evaluation of a Low Energy Universal Gate for VLSI with 16nm Technology. NTU Journal of Engineering and Technology. 1, 3 (Sep. 2022). DOI:https://doi.org/10.56286/ntujet.v1i3.209.